About VC SpyGlass Lint

The VC SpyGlass™ linting solution integrates industry-standard best practices with Synopsys’ extensive experience working with industry-leaders. Lint checks include design reuse compliance checks such as STARC and OpenMORE to enforce a consistent style throughout the design, ease the integration of multi-team and multi-vendor IP, and promote design reuse.

VC SpyGlass Lint uses inbuilt formal techniques to pinpoint deeper functional problems in RTL designs without requiring test benches or assertions. The integrated solution of traditional linting technology with formal technology leverages the comprehensive and widely used lint checks within functional lint flow resulting in noise reduction and improved accuracy of results. The Functional Lint analysis coupled with the increased ease of use results in advanced debugging and interactivity.

Key Benefits

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Identify Critical RTL Design Issues

Sophisticated static and dynamic analysis with GuideWare™ Methodology

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ML-Based Root Cause Analysis

Easier and faster handling of millions of violations

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Electrical Rules Check

Integrated comprehensive set of electrical rules check to ensure netlist integrity

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Single-Step Inbuilt Formal Flow

For noise reduction

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Comprehensive Variety of Rulesets

Design Reuse Compliance Checks: STARC, OpenMORE, ISO 26262 and DO-254 rulesets

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Verdi® Integration

Provides a debug environment to enable easy cross-probing

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Efficient Rule Execution

Tcl shell for efficient rule execution and design querying

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SoC Abstraction Flow

Faster performance and low noise

Features

VC SpyGlass RTL Signoff Chart

A multitude of coding styles, structural and electrical design issues can manifest themselves as design bugs and result in design iterations or silicon respins. Other tools may detect design bugs but often at late stages of design implementation, after a significant investment in time and effort has already been made. As design teams become geographically dispersed, consistency and correctness of design intent become a key challenge for chip integration teams. Emphasis on design reuse and IP integration requires that design elements be integrated and meet guidelines for correctness and consistency within a shorter span than necessary.

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